OHLABS
ENKRTW

Technology

High-frequency ultrasound, scanning architecture, and analysis software.

This page frames OHLABS as a technology owner first. Products become easier to trust when buyers can understand the inspection principle and evidence flow.

High-Frequency Ultrasound

Core acoustic inspection technology for visualizing internal defects without cutting, polishing, or damaging the sample.

  • Internal void, crack, and delamination detection
  • Material interface analysis
  • Non-destructive sample review workflow

FSAM Scanning Architecture

Fast scanning acoustic microscopy architecture designed for advanced packaging, wafer, and precision material inspection.

  • Scanning matrix control
  • C-scan image acquisition
  • Automation-ready inspection flow

Laser Ultrasound Microscopy

Laser-based ultrasound inspection concept for contact-sensitive samples and advanced research workflows.

  • Non-contact excitation direction
  • Microscopy-scale defect visualization
  • Research-to-industrial expansion path

AI Defect Analysis

Software-assisted image review for classifying defect patterns and turning scan images into actionable engineering evidence.

  • Defect pattern grouping
  • Scan result comparison
  • Engineer-friendly reporting structure