High-frequency ultrasound, scanning architecture, and analysis software.
This page frames OHLABS as a technology owner first. Products become easier to trust when buyers can understand the inspection principle and evidence flow.
High-Frequency Ultrasound
Core acoustic inspection technology for visualizing internal defects without cutting, polishing, or damaging the sample.
Internal void, crack, and delamination detection
Material interface analysis
Non-destructive sample review workflow
FSAM Scanning Architecture
Fast scanning acoustic microscopy architecture designed for advanced packaging, wafer, and precision material inspection.
Scanning matrix control
C-scan image acquisition
Automation-ready inspection flow
Laser Ultrasound Microscopy
Laser-based ultrasound inspection concept for contact-sensitive samples and advanced research workflows.
Non-contact excitation direction
Microscopy-scale defect visualization
Research-to-industrial expansion path
AI Defect Analysis
Software-assisted image review for classifying defect patterns and turning scan images into actionable engineering evidence.